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Advanced Analytical (Scanning) Transmission Electron Microscope ((S)TEM) optimised for structural and chemical characterisation of beam sensitive materials

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What the buyer wrote

The University of Manchester is looking to acquire an advanced analytical (scanning) transmission electron microscope ((S)TEM) optimised for structural and chemical characterisation of beam sensitive materials. Currently TEM is used extensively in the study of inorganic materials which often exhibit good thermal and electrical conductivity or highly stable bonding and structure, making them able to withstand the high energy density experienced in focussed electron beams and several hundred kilovolt acceleration. The development of new generation high sensitivity and high speed direct or hybrid detectors means that the energy dose can be reduced to the point where other types of materi…

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Details

What the buyer calls it
Advanced Analytical (Scanning) Transmission Electron Microscope ((S)TEM) optimised for structural and chemical characterisation of beam sensitive materials
How they are buying
Advertised, open to anyoneAny supplier could bid without being invited first.
Type
goods
Work starts
2 Dec 2019
Work ends
31 Mar 2020

Who the buyer named

Mark Worrall was the named contact on this notice.

mark.worrall@manchester.ac.uk