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Cryogenic focused ion beam field emission gun scanning electron microscope & confocal laser scanning light microscope - AWARD

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What the buyer wrote

Cryogenic, focused ion beam (FIB), field emission gun (FEG), scanning electron microscope (SEM) (CryoFIB-FEGSEM), flexibly configured to enable the controlled sectioning and transfer, high-resolution 3D imaging and chemical mapping of a wide range of soft, delicate, organic, hydrated and temperature sensitive materials, all under near liquid nitrogen conditions (aka "High Resolution, Cryogenic Analytical and Transfer SEM" (HR-CAT-SEM)) (LOT1). In addition, we invite tenders for a complementary, high-end, confocal laser scanning light microscope (CLSM), with region of interest (ROI) identification capabilities, through the use of optical trapping and laser branding, for multi-s…

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Awarded to

Carl Zeiss Ltd£1.5mends (9 Sep 2024)

Details

What the buyer calls it
Cryogenic focused ion beam field emission gun scanning electron microscope & confocal laser scanning light microscope - AWARD
How they are buying
Advertised, open to anyoneAny supplier could bid without being invited first.
Type
goods
Work starts
10 Sep 2019
Work ends
9 Sep 2024

Who the buyer named

karella Henegan was the named contact on this notice.

karella.henegan@nottingham.ac.uk