What the buyer wrote
The University of Leeds is seeking tenders for an ex situ (standalone) spectroscopic ellipsometer. The system will be used for research and should offer flexibility of use, having the ability to measure the properties of thin-films (including isotropic and anisotropic single films and multiple layer stacks) deposited on Si, GaAs and quartz substrates amongst others. The system must be capable of measuring the thickness (and other optical properties) of: o ALD-deposited oxides and nitrides of: Sn, Hf, Al, Ti amongst others (typical film thickness < 50 nm). In particular, measurement of 1.8 ? Al2O3 films grown on Si (plus its native oxide) is required. o PECVD-deposited silicon o…
Details
- What the buyer calls it
- E/2797 - Ellipsometer
- How they are buying
- The buyer did not say
- Type
- goods
- Work starts
- 30 Jul 2017
- Work ends
- 30 Jul 2022
- Kind of work
- Health and social care
Who the buyer named
The buyer published a contact address on this notice.