Fast-Scan High-Resolution Atomic Force Microscope For Nanoscale Dielectric Microscopy

The University wishes to appoint a Contractor or Contractor's to supply a fast-scan high-resolution atomic force microscope (AFM) to do nanoscale dielectric microscopy. The microscope should be able to probe the dielectric properties as well as structural and mechanical properties of the sample with true atomic resolution and high-speed capabilities upgradable to video-rate imaging. It needs to be capable to provide quantitative dielectric maps at the nanoscale in a wide frequency bandwidth (at least up to MHz range) with the ability to customize the system for more advanced experiments. It needs to be capable to work in multiple environments - air, liquid and gas - in an environmental cell …

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