High-Voltage Semiconductor Probing System and Parameter Analyser System - AWARD
What the buyer wrote
The University of Warwick has a requirement to update its high voltage characterisation facility comprising a parameter analyser and probe station (prober). The combined facility will be capable of making current-voltage (I-V) and capacitance-voltage (C-V) measurements on power semiconductor devices made in house, both on-wafer (or on-chip) through the use of the prober, and packaged. This tender is split into two separate lots; o Lot 1 - High-Voltage Semiconductor Probing System (Prober) o Lot 2 - High-Voltage Parameter Analyser System In order to express interest in this opportunity please go to the University of Warwick In-Tend supplier port…
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Details
- What the buyer calls it
- High-Voltage Semiconductor Probing System and Parameter Analyser System - AWARD
- How they are buying
- Advertised, open to anyoneAny supplier could bid without being invited first.
- Type
- goods
- Suitable for small firms
- The buyer says yes. What that is worth
- Work starts
- 10 Sep 2017
- Work ends
- 10 Sep 2018
Who the buyer named
Ann-Marie Cooper was the named contact on this notice.