What the buyer wrote
One imaging spectroscopic ellipsometer capable of providing information on the thickness and optical properties (over a range of wavelengths, at least 250nm to 1000nm) of thin regions on planar substrates. A key specification for this instrument is the lateral ellipsometric resolution. We already have a high quality spectroscopic ellipsometer on-site which has a minimum spot-size around 250 microns in diameter. We now wish to improve the lateral resolution of our ellipsometry measurements to the micron-scale. We want to be able to measure the optical properties of micron-scale regions of graphene, boron nitride and other two-dimensional materials on planar substrates. We will …
Details
- What the buyer calls it
- Imaging Ellipsometer_ITT990
- How they are buying
- Advertised, open to anyoneAny supplier could bid without being invited first.
- Type
- goods
- Work starts
- 14 Jan 2019
- Work ends
- 31 May 2019
- Kind of work
- SEN and inclusion services
Who the buyer named
Helen Forsythe was the named contact on this notice.