What the buyer wrote
This contract is a one-off supply only and has now been awarded. Dual Beam Focused Ion Beam –Scanning Electron Microscope instrument. The instrument will be used for the investigation of a wide range of materials, including polymers, metals, ceramics, glasses, composites, semiconductors, nanomaterials, nanostructures and coatings. For the purposes of this procurement our requirements have been divided into 3 lots as follows:- Lot 1 – Focused Ion Beam Scanning Electron Microscope (FIB SEM) system. Lot 2 – Cooling system for FIB SEM. Lot 3 – Energy Dispersive spectroscopy system for FIB SEM. Additional information: This contract is for a one-off supply of scientific equipment, includi…
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Awarded to
Details
- What the buyer calls it
- Ion Beam Facility
- How they are buying
- Advertised, open to anyoneAny supplier could bid without being invited first.
- Type
- goods
- Work starts
- 24 Sep 2015
- Work ends
- 31 Mar 2016
Who the buyer named
Procurement Team was the named contact on this notice.