Multi-purpose Automated High Throughput X-ray Diffractometer and Sample Changer for Grazing Incidence and Bulk Sample Measurements

We require an x-ray diffraction instrument for the Department of Materials X-ray characterization laboratory. We intend to use this diffractometer to characterise polycrystalline and powder samples from a range of research fields. It will be replacing existing specialist equipment optimised to measure in grazing incidence modes to bias the signal from the sample to the top surface layers. The region of interest in the surface layer may have only a few microns of depth or several hundred microns depending on the research field, GO films vs. thermal barrier coatings. We will use the diffractometer in reflection geometry with the 1D or equivalent detector, in order to characterise the 'surface'…

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