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The Crier

Nanoindenter for a Scanning Electron Microscope

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What the buyer wrote

The equipment we are looking for should enable the mechanical testing of materials within a scanning electron microscope (SEM) via insertion of a vacuum compatible mechanical testing holder/stage. The mechanical testing device should have mechanisms for enabling both Nanoindentation and Scratch testing methodologies, under specified loading conditions, together with in-situ measurement of applied load and position. The mechanical testing device should be transferable between the air and microscope column, be compatible with the high vacuum of the SEM, and fit within specified microscope geometries. Additional information: The tender documents can be obtained via the In-tend site follo…

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Awarded to

CN Technical Services Limited£105kends (30 Mar 2018)

Details

What the buyer calls it
Nanoindenter for a Scanning Electron Microscope
How they are buying
Advertised, open to anyoneAny supplier could bid without being invited first.
Type
goods
Suitable for small firms
The buyer says yes. What that is worth
Work starts
28 Mar 2018
Work ends
30 Mar 2018

Who the buyer named

The buyer published a contact address on this notice.

l.w.marsden@sheffield.ac.uk