Wide-Bandgap Dynamic Reliability & Robustness Power Characterisation Tester
What the buyer wrote
The University of Warwick has a requirement to purchase a Dynamic Reliability & Robustness Power Characterisation Tester designed for testing wide bandgap (SiC and GaN) power semiconductor device. In order to express interest in this opportunity please go to the University of Warwick In-Tend supplier portal (https://in-tendhost.co.uk/universityofwarwick). The University of Warwick is not a contracting authority for the purposes of the Public Contracts Regulations 2015 (as amended) or the Procurement Act 2023 and associated Procurement Regulations 2024 (and as may be amended from time to time) and its procurement activities are not subject to the requirements set out therein or the obligatio…
Details
- What the buyer calls it
- Wide-Bandgap Dynamic Reliability & Robustness Power Characterisation Tester
- How they are buying
- Advertised, open to anyoneAny supplier could bid without being invited first.
- Type
- goods
- Kind of work
- Marketing, advertising and communications
Who the buyer named
The buyer published a contact address on this notice. Questions closed on 22 Dec 2025, 12:00 GMT.